An Optimized Test Method Based on IC-Stripline TEM Cell

Chen Ledong, Jianfei Wu, Hongli Zhang, Yifei Zheng, Wu Jianyu

DOI

10.17023/ya8t-v128

EMC

Members: Free
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Length: 00:07:01

30 Sep 2021

Chairs:

Prof. Wen-Yan Yin

Tags:

emc measurements and em environment

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