Development of Immunity Test Method for LongDuration Induced Noise on a Wearable Devices by Electrostatic Discharge

Musashi Tanaka, Takahiro Yoshida

DOI

10.17023/4032-6063

EMC

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Length: 00:16:29

28 Sep 2021

Chairs:

Takahiro Yoshida

Tags:

esd and transients

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